Discussion Group B1: Difference between revisions
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== Presentations == | == Presentations == | ||
* Presentation by leader: [[media:canSAS2015_Discussion_-_Understanding_Instrumental_Artefacts.pdf | Nomadic utopia: towards a better understanding of all instrumental artifacts]] - <b>Charles Dewhurst</b> | |||
== Discussion Notes == | |||
Discussion on Data Corrections (N=neutrons, X=X-rays) | |||
Detectors: | |||
There are a lot of stories on what not to do. I would be nice to put some of these stories online. | |||
Some advice: | |||
N Don’t stagger detector tubes, the partial shielding is nontrivial to correct for (Ken Littrell) | |||
N recalibrate position every so often to compensate for stretch and offset caused by charge division electronics instability. | |||
N Coincidence detectors are difficult to correct for (with the compensation dome on top) | |||
N Boron technology detectors will have their own issues, corrections and complications. | |||
X Not able to measure direct beam on the same detector. Can be resolved by: | |||
- partially transparent beamstop, | |||
- attennuator as beamstop | |||
- pin-diodes (should be placed close to sample to determine transmission according to Richard Heenan’s definiton). | |||
X Difficult to measure flat field, can be done by: | |||
- Glassy carbon, | |||
- moving detector across the beam | |||
- Careful when measuring: only flat field should be determined, not the other corrections! | |||
Other advice: | |||
- Add resolution in SAXS and SANS, both lab and facility | |||
- Minimise air in all techniques! | |||
- how to deal with resolution? | |||
- traceability of corrections are needed (provenance) | |||
- calibration sample should be available at facilities | |||
- much more information needs to be available everywhere (make a list?) | |||
- Desmear on lab-sources | |||
- How far can you correct with background correction? | |||
N TOF choppers can be a big source of background. | |||
N Shield around active elements (and put holes in the right place) | |||
N Cover aigrets with absorbing tubes | |||
N Recommended slit design: use B4C with sintered edge. |
Latest revision as of 02:41, 21 April 2015
Nomadic utopia: towards a better understanding of all instrumental artifacts
Discussion Leaders
- Charles Dewhurst (ILL)
- Brian Pauw (NIMS)
Presentations
- Presentation by leader: Nomadic utopia: towards a better understanding of all instrumental artifacts - Charles Dewhurst
Discussion Notes
Discussion on Data Corrections (N=neutrons, X=X-rays)
Detectors:
There are a lot of stories on what not to do. I would be nice to put some of these stories online. Some advice:
N Don’t stagger detector tubes, the partial shielding is nontrivial to correct for (Ken Littrell) N recalibrate position every so often to compensate for stretch and offset caused by charge division electronics instability. N Coincidence detectors are difficult to correct for (with the compensation dome on top) N Boron technology detectors will have their own issues, corrections and complications.
X Not able to measure direct beam on the same detector. Can be resolved by: - partially transparent beamstop, - attennuator as beamstop - pin-diodes (should be placed close to sample to determine transmission according to Richard Heenan’s definiton). X Difficult to measure flat field, can be done by: - Glassy carbon, - moving detector across the beam - Careful when measuring: only flat field should be determined, not the other corrections!
Other advice:
- Add resolution in SAXS and SANS, both lab and facility - Minimise air in all techniques! - how to deal with resolution? - traceability of corrections are needed (provenance) - calibration sample should be available at facilities - much more information needs to be available everywhere (make a list?) - Desmear on lab-sources - How far can you correct with background correction? N TOF choppers can be a big source of background. N Shield around active elements (and put holes in the right place) N Cover aigrets with absorbing tubes N Recommended slit design: use B4C with sintered edge.